Search results Search for: Search Refine your results by duration: Any Under 5 mins Under 20 mins Over 20 mins Sort by: Relevance Views Date Exploring flatlands: characterizing 2D materials with atomic force microscopy Prof. Andras Kis, EPFL, STI-IEL-LANES and Keith Jones, Oxford Instruments Asylum Research The atomic force microscope (AFM) has played an essential role in 2D materials research since it was used to confirm the first isolation of graphene. ... 7 years ago | 60 mins Celebrating 30 years of AFM and STM Franz Giessibl, Mervyn Miles, Sergei Kalinin, Igor Sokolov and Malgorzata Kopycinska-Müller To celebrate the 30th anniversary of the Nobel prize in scanning tunnelling microscopy (STM) and the 30th anniversary since the first paper in atomic ... 7 years ago | 60 mins Correlative 3D Raman Imaging: Advancing Semiconductors & Energy Storage Devices Dr Thomas Dieing: Director Applications and Support This webinar aims to highlight the benefits of correlative Raman imaging for the analysis of chemical composition, crystallinity, stress and optoelect... 7 years ago | 59 mins