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Firmware Integrity Measurements and Attestation

Presented by

Dick Wilkins, Phoenix Technologies

About this talk

In 2011, the USG National Institute of Standards and Technology (NIST) published a draft of “BIOS Integrity Measurement Guidelines” (NIST Special Publication 800-155). For various reasons, these guidelines have not been widely accepted or implemented. Last year, NIST entered a collaboration with the Trusted Computing Group (TCG) to develop specifications that could be industry accepted and TCG has started publishing drafts of these specifications. This presentation will update the UEFI Forum membership on the status of this collaboration and how it will likely affect platform firmware.
UEFI Forum

UEFI Forum

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Webinars for the Firmware Community
Through a collaborative approach with world-class companies, institutions and experts, the UEFI Forum advances innovation in firmware technology standards. These extensible, globally-adopted UEFI specifications bring new functionality and enhanced security to the evolution of devices, firmware and operating systems.
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