Lift off: How Lockheed Martin Accelerates Automation with Micro Focus UFT

Presented by

Kristin Colbert, Enterprise IT Test Automation Manager, Lockheed Martin and Chris Dion, ADM Solution Architect, Micro Focus

About this talk

In testing, as in flight, errors are bad and speed a valuable commodity. While most businesses merely strive to test earlier and faster, Lockheed Martin is actually doing it, using Micro Focus UFT to give their testing a vital lift. Listen as Kristin Colbert of Lockheed Martin shares how her team is using frameworks and templates to improve UFT maintenance and adoption, and UFT to improve in CI/CD/CT pipelines. In addition, Micro Focus expert Chris Dion explains how incorporating the new AI capabilities of Micro Focus UFT One into your testing efforts will make your testing program fly. Join us to learn: • How AI is different than object property-based identification • How AI reduces your maintenance time • How easy it is to use UFT One to implement AI into new and existing tests for enterprise apps

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